Professor Xiaoliang Sunney Xie 
Patents
  • Xie, X. Sunney; Ganikhanov, Feruz; Evans, Conor

Patent No: US 7,352,458 B2

  System and Method for High Sensitivity Vibrational Imaging with Frequency Modulation Coherent Anti-Stokes Raman Scattering Analyses
  • Xie, X. Sunney; Cheng, J.-X.

Patent No: US 6,798,507

System and Method for Polarization Coherent Anti-stokes Raman Scattering Microscopy
  • Xie, X. Sunney; Cheng, J.-X.; Volkmer, Andreas

Patent No: US 6,809,814

System and Method for Epi-Detected Coherent Anti-stokes Raman Scattering Microscopy
  • Holtom, Gary A. ; Xie, X. Sunney; Zumbusch, Andreas
Patent No: US 6,108,081
Non-linear Vibrational Microscopy
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